Time-of-flight peak profiles¶
Let \(\delta=t-t_h\) in microseconds. The bank geometry supplies the wavelength of each reflection; calibration maps spacing to the peak centre.
Gaussian and Lorentzian width terms¶
Here \(v_0,v_1,v_2\) denote the stored variance coefficients labelled σ₀², σ₁² and σ₂²; the superscript is part of the variance notation, not an instruction to square their stored values again. The broad_gauss_sigma_* coefficients are variance coefficients, not standard deviations or FWHMs. broad_lorentz_gamma_* coefficients define Lorentzian FWHM. Keep their respective time/spacing units; see the parameter index.
Symmetric pseudo-Voigt¶
tof-pseudo-voigt uses the TCH width/mixing, with \(H_G,H_L\) in microseconds, and the symmetric unit-area pseudo-Voigt. It does not add the back-to-back exponential pulse.
Jorgensen pulse and profile¶
tof-jorgensen convolves a two-sided exponential pulse with a Gaussian. The rates are
with positive evaluated rates in inverse microseconds. Let \(N=\alpha\beta/[2(\alpha+\beta)]\) and \(\sigma\) be the Gaussian standard deviation:
The normalisation already includes the Gaussian-convolution factors; do not reuse \(N\) as if it alone normalised a bare piecewise exponential. The numerical evaluation uses stable exponential/error-function combinations to avoid overflow without changing this equation.
Jorgensen–Von Dreele¶
tof-jorgensen-von-dreele adds the Lorentzian contribution through a common TCH width \(H\) and mixing \(\eta\):
Both terms use that combined width: \(\sigma=H/\sqrt{8\ln2}\) in \(\Omega_G\) and FWHM \(H\) in \(\Omega_L\).
\(E_1\) is the exponential integral. At zero Lorentzian width the profile reduces to its Gaussian Jorgensen limit; assigning a different width to each mixed kernel would define a different model.
Ikeda–Carpenter¶
Planned. Ikeda–Carpenter is planned for TOF pulse modelling. It is not a selectable profile in this reference snapshot. See Time-of-flight peak profiles for the availability of this and the implemented profiles.
References¶
- Von Dreele, R. B., Jorgensen, J. D. & Windsor, C. G. (1982). Journal of Applied Crystallography, 15, 581–589. Time-of-flight profile modelling.
- Thompson, P., Cox, D. E. & Hastings, J. B. (1987). Journal of Applied Crystallography, 20, 79–83. DOI. Width and mixing convention.